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D3T-2008
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The IEEE International Workshop on Defect and Data Driven Testing (D3T-2008) (Formerly known as
Defect-Based Testing Workshop (DBT)) Visit http://d3t.tttc-events.org/ October 30 - 31, 2008 Santa Clara Convention
Center, Santa Clara, CA Will be held in conjunction with ITC Test Week (ITC-2008) Submission Deadline: August 26, 2008 Notification of Acceptance:
September 19, 2008 Camera Ready Paper: September 26, 2008 |
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Theme: Date Driven Testing (DDT) Technology
scaling is introducing yield as main issue to design and test engineers.
Various types of defects are presenting unique challenges to the yield
enhancement community. New test date based methodologies are required to
detect, monitor, and comprehend the various defect mechanisms at sub-50nm
technology nodes and their impact on yield. Data-driven testing (DDT) has
been in practice for a number of years and often used for yield learning and
analysis. It is now gaining attention more than ever in adaptive test. DDT
uses data to reduce defect levels, increase reliability, and to diagnose and
solve yield problems. DDT can provide feedbacks on which tests to add/remove,
or test subsets (e.g. reduced MINVDD test sets). It can also be utilized for
improving quality of logic test patterns (e.g. small delay defect,
defect-based) vs. outlier analysis tests (e.g. MINVDD, IDDQ). However, test
data has not been easily accessible by smaller companies and researchers in
academia. These issues will be discussed in this year’s D3T workshop. The
IEEE International Workshop on Defect and Data-Driven Testing (D3T 2008) is
aimed at addressing these issues and others related to this year’s
theme “Data-Driven Testing (DDT)”. Paper presentations on topics
related to the workshop’s theme and to those given below are expected
to generate active discussion on the challenges that must be met to ensure
high IC quality through the end of the decade.
To present at the workshop, submit a postscript
or Acrobat (PDF) version of an extended abstract of at least 1000 words via
E-mail to the Program Chair by Sep. 1, 2008. Each submission should include
full name and address of each author, affiliation, telephone number, FAX and
Email address. The presenter should also be identified. Camera-ready papers
for inclusion in the digest of papers will be due on Oct. 6, 2008.
Presentations on cutting edge test technology, innovative test ideas, and
industrial practices and experience are welcome. Proposals for Embedded
Tutorials, Debates, Panel Discussions or “Spot-Light”
presentations describing industrial experiences are also invited.
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